EMU: Acquisition of Monochromatic X-ray Source and 2D-CMOS detector for Photoelectron Spectroscopy (XPS)

• Grant number: 23/16984-1
• Support Opportunities: Research Infrastructure Program - Small Medium Sized
• Start date: September 01, 2024
• End date: August 31, 2027
• Field of knowledge: Physical Sciences and Mathematics - Physics - Condensed Matter Physics
• Principal Investigator: Abner de Siervo
• Grantee: Abner de Siervo
• Host Institution: Instituto de Física Gleb Wataghin (IFGW). Universidade Estadual de Campinas (UNICAMP). Campinas , SP, Brazil
• City of the host institution: Campinas
• Associated researchers: Thiago Regis Longo Cesar da Paixão ; Varlei Rodrigues

Abstract

The surface physics group (GFS) at IFGW has worked over the years to study the most diverse surface systems using established techniques, such as X-ray excited photoelectron spectroscopy (XPS). This specific elemental and chemical technique is fundamental for better understanding the chemical composition and electronic structure of materials, such as nanoparticles, thin films, semiconductors, supercapacitors, intermetallic alloys, oxides, etc. These new materials encompass various applications, from new quantum materials, catalysts, sensors, batteries, protective films, new alloys, and materials for bio-compatible implants. In this way, countless collaborators and independent users from different areas (physics, chemistry, engineering, materials, dentistry, etc.) also use this equipment acquired over 15 years ago in a FAPESP Thematic project. When it was purchased, we planned to install a monochromatic X-ray source, which was impossible due to budget restrictions. Despite this, a series of systems involving small samples and samples requiring higher energy resolution and elemental sensitivity will significantly benefit from upgrading the photon source and electron detectors. In this EMU-PMP project, we propose acquiring a monochromatic and focused X-ray source and a state-of-the-art 2D-CMOS sensor set, enabling measurements on smaller samples with three times better resolution and around ten times faster acquisition speed. Furthermore, the new 2D-CMOS sensor will open the doors to future ARPES (angle-resolved photoemission spectroscopy) implementation in this system. (AU)