Influence of extrinsic factors on the properties of PZT ultrathin films

• Grant number: 10/16504-0
• Support Opportunities: Regular Research Grants
• Start date: March 01, 2011
• End date: February 28, 2013
• Field of knowledge: Physical Sciences and Mathematics - Physics - Condensed Matter Physics
• Principal Investigator: Eudes Borges de Araújo
• Grantee: Eudes Borges de Araújo
• Host Institution: Faculdade de Engenharia (FEIS). Universidade Estadual Paulista (UNESP). Campus de Ilha Solteira. Ilha Solteira , SP, Brazil
• Associated researchers: Reginaldo Naves dos Reis

Abstract

The ferroelectricity phenomenon exhibit an intrinsic dependence with respect to sample size due to the different level of planning that takes place on surfaces and interfaces. This research project intends to study the influence of sample size on the structural, microstructural and dielectric properties of thin and ultrathin films of the PbZr1-xTixO3 (PZT) ferroelectric system. Specific compositions of the Morphotropic Phase Boundary (MPB), in the temperature-composition (T-x) phase diagram, will be investigated in order to establish the mutual relationship between extrinsic factors, such as compositional fractions, thickness, residual stresses and electric field, and structural phase transitions of PZT films. The research should promote a redefinition of boundaries for the existence of the monoclinic phase in the T-x phase diagram and understanding the phenomena responsible for the effects arising from the size reduction of PZT films. (AU)

Scientific publications

(10)

(References retrieved automatically from Web of Science and SciELO through information on FAPESP grants and their corresponding numbers as mentioned in the publications by the authors)

LIMA, E. C.; ARAUJO, E. B.; SOUZA FILHO, A. G.; PASCHOAL, A. R.; BDIKIN, I. K.; KHOLKIN, A. L.. Structural depth profile and nanoscale piezoelectric properties of randomly oriented Pb(Zr0.50Ti0.50)O-3 thin films. JOURNAL OF PHYSICS D-APPLIED PHYSICS, v. 45, n. 21, MAY 30 2012. (07/08534-3, 10/16504-0)

CORNELIUS, T. W.; MOCUTA, C.; ESCOUBAS, S.; MERABET, A.; TEXIER, M.; LIMA, E. C.; ARAUJO, E. B.; KHOLKIN, A. L.; THOMAS, O.. Piezoelectric response and electrical properties of Pb(Zr1-xTix)O-3 thin films: The role of imprint and composition. Journal of Applied Physics, v. 122, n. 16, OCT 28 2017. (10/16504-0)

DAVYDOK, A.; CORNELIUS, T. W.; MOCUTA, C.; LIMA, E. C.; ARAUJO, E. B.; THOMAS, O.. In situ X-ray diffraction studies on the piezoelectric response of PZT thin films. Thin Solid Films, v. 603, p. 29-33, MAR 31 2016. (10/16504-0)

ARAUJO, E. B.; LIMA, E. C.; BDIKIN, I. K.; KHOLKIN, A. L.. Imprint effect in PZT thin films at compositions around the morphotropic phase boundary. Ferroelectrics, v. 498, n. 1, 2, SI, p. 18-26, 2016. (07/08534-3, 10/16504-0)

LIMA, E. C.; ARAUJO, E. B.. Role of residual stress on phase transformations of Pb(Zr0.50Ti0.50)O-3 thin films obtained from chemical route. Ferroelectrics, v. 499, n. 1, 3, SI, p. 28-35, 2016. (07/08534-3, 10/16504-0)

LIMA, E. C.; ARAUJO, E. B.; BDIKIN, I. K.; KHOLKIN, A. L.. Effect of Composition on the Physical Properties at Nanoscale of PZT Thin Films. Ferroelectrics, v. 465, n. 1, SI, p. 106-114, JUN 11 2014. (07/08534-3, 10/16504-0, 13/12642-7)

LIMA, E. C.; ARAUJO, E. B.; BDIKIN, I. K.; KHOLKIN, A. L.. The self-polarization effect in Pb(Zr0.50Ti0.50)O-3 thin films with no preferential orientation. Materials Research Bulletin, v. 47, n. 11, p. 3548-3551, NOV 2012. (07/08534-3, 10/16504-0)

LIMA, E. C.; ARAUJO, E. B.; BDIKIN, I. K.; KHOLKIN, A. L.. Effect of Composition on the Physical Properties at Nanoscale of PZT Thin Films. Ferroelectrics, v. 465, n. 1, p. 9-pg., 2014-06-11. (07/08534-3, 13/12642-7, 10/16504-0)

LIMA, E. C.; ARAUJO, E. B.. Role of residual stress on phase transformations of Pb(Zr0.50Ti0.50)O-3 thin films obtained from chemical route. Ferroelectrics, v. 499, n. 1, p. 8-pg., 2016-01-01. (07/08534-3, 10/16504-0)

ARAUJO, E. B.; LIMA, E. C.; BDIKIN, I. K.; KHOLKIN, A. L.. Imprint effect in PZT thin films at compositions around the morphotropic phase boundary. Ferroelectrics, v. 498, n. 1, p. 9-pg., 2016-01-01. (07/08534-3, 10/16504-0)