Microstructure characterization of agglomerations formed on ni and ni(pt) silicide thin films with sem/eds.

• Grant number: 03/02502-1
• Support Opportunities: Research Grants - Meeting - Abroad
• Start date: December 07, 2003
• End date: December 12, 2003
• Field of knowledge: Engineering - Electrical Engineering - Electrical Materials
• Principal Investigator: Ioshiaki Doi
• Grantee: Ioshiaki Doi
• Host Institution: Faculdade de Engenharia Elétrica e de Computação (FEEC). Universidade Estadual de Campinas (UNICAMP). Campinas , SP, Brazil