| Grant number: | 07/05165-7 |
| Support Opportunities: | Scholarships in Brazil - Post-Doctoral |
| Start date: | July 01, 2008 |
| End date: | June 30, 2010 |
| Field of knowledge: | Physical Sciences and Mathematics - Physics - Condensed Matter Physics |
| Principal Investigator: | Antonio José Ramirez Londono |
| Grantee: | Luciano Andrey Montoro |
| Host Institution: | Associação Brasileira de Tecnologia de Luz Síncrotron (ABTLuS). Campinas , SP, Brazil |
Abstract In this work we consider the development and application of methodologies for quantitative analysis from transmission electron microscopy images. This proposal aims in a first time the development; implementation and use of advanced techniques of focal series reconstruction for achieve high quality and free aberrations images with an increase in point-to-point resolution and accuracy of quantitative results. For quantitative studies will be implemented the geometric phase analysis (GPA), that it allow to obtain the strain tensors (Exx, Eyy), the width between adjacent atomic columns, and the local cell parameters. From this cell parameters and applying the Vegards Law, will be calculated the atomic scale chemical composition of this nanostructures. 2D and 3D chemical maps will be obtained from these results. These methodologies will be applied to study of Si1-xGex islands - a nanostructured semiconductor. The implementation of these methodologies for reconstruction and data treatment will be allow improve the performance of the transmission microscopes and make practicable to users of LME-LNLS facilities the development of studies and works with high spatial resolution (1 Å). (AU) | |
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