Investigation of silicon-based materials by micro and nano characterization techniques

• Grant number: 06/04245-4
• Support Opportunities: Scholarships abroad - Research
• Start date: February 19, 2007
• End date: July 18, 2007
• Field of knowledge: Physical Sciences and Mathematics - Physics - Condensed Matter Physics
• Principal Investigator: Antonio Ricardo Zanatta
• Grantee: Antonio Ricardo Zanatta
• Host Investigator: Martin Eric Kordesch
• Host Institution: Instituto de Física de São Carlos (IFSC). Universidade de São Paulo (USP). São Carlos , SP, Brazil
• Institution abroad: Ohio University, United States

Abstract

The main purpose of this short-term research program is the investigation of Si-based materials by means of high-resolution experimental techniques. The target samples, prepared in the form of thin films, will consist of SiN alloys doped with rare-earth ions and Si films containing Ni or Fe species. The program will start with some basic characterization (essentially optical and compositional) and will be complemented by transmission electron microscopy (TEM), near-field scanning optical microscopy (NSOM), and photoelectron microscopy (PEM). Following this approach we expect to advance our present knowledge on the optical-electronic properties of these technologically important materials. The program also contemplates my initiation on the study of dynamic reactions and of gold nano-particles. In brief, the implementation of this project will be an excellent opportunity to improve my current skills in the field of nano-sciences (more specifically in high-resolution characterization techniques), as well as to establish the scientific cooperation between the present American (Prof. Kordesch) and Brazilian (Dr. Zanatta) groups. (AU)