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Applying fault models in complete test suite generation from Input/Output Transition Systems

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Author(s):
Sofia Larissa da Costa Paiva
Total Authors: 1
Document type: Doctoral Thesis
Press: São Carlos.
Institution: Universidade de São Paulo (USP). Instituto de Ciências Matemáticas e de Computação (ICMC/SB)
Defense date:
Examining board members:
Adenilso da Silva Simão; Wilkerson de Lucena Andrade; Eliane Martins; Ana Cristina Vieira de Melo; Simone do Rocio Senger de Souza
Advisor: Adenilso da Silva Simão
Abstract

Model-Based Testing (MBT) has emerged as a promising strategy for the minimization of problems related to time and resource limitations in software testing and aims at checking whether the implementation under test is in compliance with its specification. Test cases are automatically generated from behavioral models produced during the software development life cycle. Among the existing modeling techniques, Input/Output Transition Systems (IOTSs) have been widely used in MBT because they are more expressive than Finite State Machines (FSMs). Despite the existence of test generation methods for IOTSs, the problem of selection of test cases is an important and difficult topic. The current methods for IOTSs are non-deterministic, in contrast to the existing theory for FSMs that provides complete fault coverage guarantee based on a fault model. This manuscript addresses the application of fault models to deterministic test generation methods from IOTSs. A method for the test suite generation based on W method for FSMs is proposed for IOTSs. It generates test suites in a deterministic way and also satisfies sufficient conditions of specification coverage and all faults in a given fault domain. Empirical studies evaluated its applicability and effectiveness. Experimental results for the analyses of the cost of test suite generation by random IOTSs and a case study with specifications from the industry show the effectiveness of the test suites generated in relation to the traditional method of Tretmans. (AU)

FAPESP's process: 12/09650-5 - Testing based on Input Output Transition Systems
Grantee:Sofia Larissa da Costa Paiva
Support Opportunities: Scholarships in Brazil - Doctorate