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| Author(s): |
Hugo Puertas de Araújo
Total Authors: 1
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| Document type: | Doctoral Thesis |
| Press: | São Paulo. |
| Institution: | Universidade de São Paulo (USP). Escola Politécnica (EP/BC) |
| Defense date: | 2004-12-08 |
| Examining board members: |
Sebastião Gomes dos Santos Filho;
Giuseppe Antonio Cirino;
Luiz Goncalves Neto;
Mikiya Muramatsu;
Jacobus Willibrordus Swart
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| Advisor: | Sebastião Gomes dos Santos Filho |
| Abstract | |
In the present work, it was investigated some properties and applications for polarization-difference images (PDI\'s), what led us to the proposition of two acquisition systems for such images as alternatives to the architecture proposed by Tyo (1996). The first system here discussed uses two cameras and two polarizers in the attainment of PDI\'s. The image elements redundancy is supposed to overcome a deficiency of the above-mentioned system that is its inability to operate in real time. The second project proposes the use of polarizing filters based on Fabry-Perot structures obtained with birefringent thin films of TiOx. Such filters are the key elements in a device that can be implemented as an integrated microsystem, fully compatible with the CMOS production technologies, available nowadays. Given the possibilities associated with this last project, it was defined as the main goal of this work, the attainment of polarizing filters based on birefringent thin films technology, physically deposited by a DC Sputtering equipment. During the phase of data analysis, it was carried out optical characterizations (spectrofotometry) as well as RBS analysis, both for the filters itself and for the TiOx films, that were previously investigated in order to determine the required parameters for the design of the interference filters. This work is concluded by proving the possibility of using polarizing filters in integrated image acquisition systems, but a remark ismade stating that the employed equipment is not the ideal one for such applications and it is suggested the use of deposition set up capable to monitor thickness and refractive indexes during the run (an example would be an e-beam equipment connected to a transmittance ellipsometer). (AU) | |