Fixing of holograms in Lithium Niobate

Author(s)

Ivan de Oliveira

• Document type: Doctoral Thesis
• Press: Campinas, SP.
• Institution: Universidade Estadual de Campinas (UNICAMP). Instituto de Física Gleb Wataghin
• Defense date: 2005-02-28

Examining board members

Jaime Frejlich; Dario Antonio Donatti; Antonio Carlos Hernandes; Mauro Monteiro Garcia de Carvalho; Lucila Helena Deliesposte Cescato

• Advisor: Jaime Frejlich

Abstract

In this work important contributions to the field and to the self stabilized holographic record in litium niobate were achieved and to the dynamic formation and hologram evolution study during different fixing stages. Other important contributions in this work refer to more efficient technique development and/or simpler ones to hologram fixing. On terms of self stabilized record our work allowed the use of these techniques to obtain some holograms with high efficiency diffractions and in a reproducible form. The self stabilized holographic record in litium niobate had already been used before. The new point here is the detailed study about the process dynamic which allowed a better understanding of the technique possibilities and limitations including the detailed study of the effect of the oxidation degree (thus the relation [Fe3+]/[Fe2+]) of the material about the stabilization system behaviour. According to the referred studies above which permitted a better understanding of the process, it was possible to develop the oxidated crystals fixing technique which permitted to get fixed nets with high diffractions efficience with predictable values according to the crystals properties and in a reproducible form. The self stabilized record was applied sucessfully to the fixing technique (recording and compensation) for the first time to high temperature in a so much simpler form than the classical one which permitted to obtain excellent results even using reduced samples to which the classical process has not worked satisfactionally. Parallel to this, we showed (theoric and experimentally) the associated problems to the diffraction efficience in thick holograms. We showed the use of an auxiliar bin (frequently used) for this kind of measure results in considerable errors and to this case we propose a so much simpler form of achieving this measure (AU)