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Computer simulation of screen-film systems response based on incident X-ray beam

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Author(s):
Marcia Aparecida Silva
Total Authors: 1
Document type: Doctoral Thesis
Press: São Carlos.
Institution: Universidade de São Paulo (USP). Instituto de Física de São Carlos (IFSC/BT)
Defense date:
Examining board members:
Annie France Frere Slaets; Adelaide de Almeida; Yvone Maria Mascarenhas; Alberto Tannus; Liliane Ventura
Advisor: Annie France Frere Slaets
Abstract

This work presents a method that simulates the performance of radiological recording systems, considering the absorption capacity, the conversion efficiency, the emission spectrum and the intrinsic efficiency of the intensifying screen, the spatial distribution of the light photon, the quantum noise, the sensibility spectrum of the radiographic film, the necessary photons to become the silver halide grain developable and a factor that includes the parameters that are not supplied directly by the manufacturer. We have implemented the algorithms using the Delphi programming language, an application development tool for Windows and personal computer, which allowed the development of a friendly interface of interaction with the user. The method predicts the influence of any screen-film system used or planned on radiographic image sharpness and allows one to simulate the contrast and the image sharpness to be obtained with a given screen-film combination in function of the x-ray exposure as well as the H&D curve this combination. (AU)