Analysis of the calibration potential of optical force through atomic force microscopy devices

Author(s)

Gustavo Pires Marques

• Document type: Master's Dissertation
• Press: Campinas, SP.
• Institution: Universidade Estadual de Campinas (UNICAMP). Instituto de Física Gleb Wataghin
• Defense date: 2005-12-19

Examining board members

Carlos Lenz César; Luiz Carlos Barbosa; Oswaldo Luiz Alves

• Advisor: Carlos Lenz César

Abstract

The atomic force microscope (AFM) is a tool that enables the measurement of precisely localized forces with unprecedented resolution in time, space and force. At the heart of this instrument is a cantilever probe that sets the fundamental features of the AFM. The objective of this research has been using the deflection of this cantilever to get a fast and accurate calibration of optical tweezers trap force, as well as testing and comparing to the traditionally used methods of calibration for this purpose. For that it was necessary to resolve and understand the sensors signals conditioning used in the AFM. Traditional cantilevers, whose detection system is based on the deflection of a laser beam in addition with a photodetector, as well as piezoresistive cantilevers has been studied. Piezoresistive cantilevers provide a simple and convenient alternative to optically detected cantilevers. Integration of a sensing element into the cantilever eliminates the need for the external laser and detector used in most AFMs. This removes the delicate step of aligning the laser to the cantilever and photodetector which usually precedes an AFM measurement, a simplification which expands the potential of the AFM for use in difficult environments such as ultrahigh vacuum chambers or, as in Optical Tweezers specific case, where there are spheres into a liquid solution as well as dimensional constraints (AU)