Full text
| |
| Author(s): |
Anderson Silva Chaves
Total Authors: 1
|
| Document type: | Master's Dissertation |
| Press: | São Carlos. |
| Institution: | Universidade de São Paulo (USP). Instituto de Física de São Carlos (IFSC/BT) |
| Defense date: | 2010-06-30 |
| Examining board members: |
Tomaz Catunda;
Marcelo Martinelli;
Lino Misoguti
|
| Advisor: | Tomaz Catunda |
| Abstract | |
The nonlinear refractive index n2 is the key parameter of the third order nonlinearity of optical materials. A simple, direct and sensitive measurement of nonlinear refractive index n2 is so-called Z-scan technique proposed by Sheik Bahae et al 1. In this work, a systematic study on this technique was performed. Based on Fresnel-Kirchhoff diffraction integral formula, it was possible to analyze the technique in order to investigate the influence of the apertures radius. We obtained unpublished analytical expressions when we consider small nonlinearities induced by thin samples. These results showed that the value of n2 obtained is about 36% larger than n2 obtained by Sheik-Bahae when the linear opening is 50%, for example.Extensions about the technique were made. Simulations were performed in order to test the feasibility of near-field Z-scan and two-color Z-scan measurements. Again it was also possible to find unpublished analytical results. The theoretical results were tested in some experiments and good agreement was found. Finally, a new method for measuring the nondegenerate refractive index was proposed. So, there is the possibility to obtain n2 at the wavelength of the probe beam in a two-color Z-scan experiment. This result is important since in many cases is impossible to perform a conventional z-scan measurement, due to the fact that the sample does not absorb the wavelength of the probe beam. A result of n2 for ruby at 633nm was obtained in good agreement with previous studies. (AU) | |