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ON THE GENERATION OF AUTOCORRELATED alpha-eta-kappa-mu FADING SEQUENCES

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Author(s):
Renno, Vanessa Mendes ; Silveira Santos Filho, Jose Candido ; IEEE
Total Authors: 3
Document type: Journal article
Source: 2021 IEEE STATISTICAL SIGNAL PROCESSING WORKSHOP (SSP); v. N/A, p. 5-pg., 2021-01-01.
Abstract

The alpha-eta-kappa-mu probabilistic model offers a general, unified description for all the essential ingredients of short-term fading. Thus far, however, it has no associated simulator as general as the model itself, becoming less attractive to design teams of real-world wireless systems. The only simulator available is limited to integer and half-integer values of the (real-valued) mu-parameter-a condition never strictly met in practice. In this work, we overcome this drawback by proposing a simulation method that allows for real values of the mu-parameter, exactly matches the first-order statistics of the alpha-eta-kappa-mu model, and closely approximates its second-order statistics. This last requirement is a long-standing issue in fading simulation. (AU)

FAPESP's process: 18/20179-9 - Advanced Simulation of Generalized Wireless Channels
Grantee:Vanessa Mendes Rennó
Support Opportunities: Scholarships in Brazil - Doctorate