Outcomes of a Parameter Sensitivity Analysis of a CT Measurement Process Through a Digital Model

Author(s)

Baldo, Crhistian R. ; Dewulf, Wim ; Iano, Y ; Saotome, O ; Vasquez, GLK ; Pezzuto, CC ; Arthur, R ; DeOliveira, GG

• Document type: Journal article
• Source: PROCEEDINGS OF THE 7TH BRAZILIAN TECHNOLOGY SYMPOSIUM (BTSYM'21): EMERGING TRENDS IN SYSTEMS ENGINEERING MATHEMATICS AND PHYSICAL SCIENCES, VOL 2; v. 295, p. 8-pg., 2022-01-01.

Abstract

CT as a measurement technology for quality control has demonstrated unprecedented potential to retrieve comprehensive dimensional information on lightweight parts with complex shapes, including geometries inaccessible to conventional sensors, therefore addressing the current needs of industrial metrology, such as the inspection of objects stemming from additive manufacturing processes. The intricate measurement chain of CT, however, gives rise to various factors that can contribute to the uncertainty associated with the result of a measurement. To develop a broader understanding of the effect of a given influence factor on the measurement outcomes, the use of computer simulation has played an increasing role. In this regard, the digital representation of a CT system optimized for dimensional metrology was created and used to investigate the relationships between input parameters that are under the control of the CT metrologist and dimensional quantities of a test object. The results observed for three influence factors (number of angular poses, image averaging, and detector noise) are presented and discussed in this paper. (AU)

• FAPESP's process: 18/24757-7 - Development of a hybrid method for uncertainty evaluation to provide traceability to dimensional measurements based on X-ray tomography
• Grantee: Crhistian Raffaelo Baldo
• Support Opportunities: Scholarships abroad - Research