Analyzing structure factor phases in pure and doped single crystals by synchrotron X-ray Renninger scanning

Author(s)

Amirkhanyan, Zohrab G. ; Remedios, Claudio M. R. ; Mascarenhas, Yvonne P. ; Morelhao, Sergio L.

• Document type: Journal article
• Source: JOURNAL OF APPLIED CRYSTALLOGRAPHY; v. 47, p. 6-pg., 2014-01-01.

Abstract

X-ray multiple diffraction has been applied to study the substitutional incorporation of Mg2+ ions into NSH crystals (nickel sulfate hexahydrate, NiSO4 center dot 6H(2)O). Intensity profiles provide information on invariant phases, while angular positions of the multiple diffractions allow accurate determination of lattice parameters. By increasing the atomic disordering only of O2- sites in model structures of doped NSH, the sense and magnitude of induced phase shifts match those necessary to justify the observed changes in the intensity profiles. Causes of disordering and lattice parameter variation are discussed. Although the amount of extra oxygen disordering is relatively large with respect to the small difference in the ionic radii of the metallic ions, this disordering is beyond the resolution power achievable by analyzing diffracted intensities of isolated reflections, such as in standard crystallographic techniques. (AU)

• FAPESP's process: 12/01367-2 - X-RAY PHASE MEASUREMENTS USED AS A PROBE OF SMALL STRUCTURAL CHANGES INDUCED BY DOPANTS IN CRYSTALS OF TECHNOLOGICAL RELEVANCE
• Grantee: Zohrab Gevorg Amirkhanyan
• Support Opportunities: Scholarships in Brazil - Post-Doctoral