X-ray diffraction mapping of strain fields and chemical composition of SiGe: Si (001) quantum dot molecules

Leite‚ MS; Gray‚ JL; Hull‚ R.; Floro‚ JA; Magalhaes-Paniago‚ R.; Medeiros-Ribeiro‚ G.

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(Reference retrieved automatically from Google Scholar through information on FAPESP grant and its corresponding number as mentioned in the publication by the authors.)

X-ray diffraction mapping of strain fields and chemical composition of SiGe: Si (001) quantum dot molecules

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Author(s):	Leite‚ MS ; Gray‚ JL ; Hull‚ R. ; Floro‚ JA ; Magalhaes-Paniago‚ R. ; Medeiros-Ribeiro‚ G. Total Authors: 6
Document type:	Journal article
Source:	Physical Review B; v. 73, n. 12, p. 121308, 2006.

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