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(Reference retrieved automatically from Google Scholar through information on FAPESP grant and its corresponding number as mentioned in the publication by the authors.)

Atomic scale patterns formed during surface scanning by atomic force microscopy tips

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Author(s):
Teschke‚ O. ; Soares‚ D.M. ; Valente Filho‚ J.F. ; de Souza‚ E.F.
Total Authors: 4
Document type: Journal article
Source: Applied Physics Letters; v. 89, n. 25, p. 253125-253125, 2006.
Abstract

In this work, tip sliding at the water/substrate interfacial region was used to investigate the pattern observed during image acquisition with atomic resolution in atomic force microscopy. The process responsible for the pattern formation is the oscillatory movement of the tip in the direction that is normal to scanning induced by a change in the water interfacial dielectric permittivity from epsilon approximate to 4 at the interface to epsilon approximate to 80 (bulk value) that results in a variation of the measured force acting on the tip of approximate to 30 pN. (c) 2006 American Institute of Physics. (AU)

FAPESP's process: 03/12529-4 - Nanotechnology: manufacture of nanostructures and supramolecular structures in liquid medium: observation of structures formed and investigation of processes of formation of nanostructures
Grantee:Omar Teschke
Support Opportunities: Research Projects - Thematic Grants