Advanced search
Start date
Betweenand
Related content
(Reference retrieved automatically from SciELO through information on FAPESP grant and its corresponding number as mentioned in the publication by the authors.)

A load effect evaluation of a transmission line exciting chamber

Full text
Author(s):
Mario. A. Santos Jr. [1] ; Damien Voyer [2] ; Ronan Perrussel [3] ; Djonny Weinzierl [4] ; Carlos. A. F. Sartori [5] ; Laurent Krähenbühl [6] ; Christian Vollaire [7] ; José R. Cardoso [8]
Total Authors: 8
Affiliation:
[1] EPUSP. PEA. LMAG - Brasil
[2] Université de Lyon. Ecole Centrale de Lyon. Lab. Ampère - França
[3] Université de Lyon. Ecole Centrale de Lyon. Lab. Ampère - França
[4] UNERJ. Centro Universitário de Jaraguá do Sul - Brasil
[5] EPUSP. PEA. LMAG - Brasil
[6] Université de Lyon. Ecole Centrale de Lyon. Lab. Ampère - França
[7] Université de Lyon. Ecole Centrale de Lyon. Lab. Ampère - França
[8] EPUSP. PEA. LMAG - Brasil
Total Affiliations: 8
Document type: Journal article
Source: J. Microw. Optoelectron. Electromagn. Appl.; v. 10, n. 1, p. 42-54, 2011-06-00.
Abstract

This paper presents an evaluation of the phase shifting excitation and load effects in a Transmission Line Exciting Chamber. This chamber is suggested as an alternative for immunity tests because of the restrictions related to canonical chambers. Here, two methods are used to calculate the E-field: a semi-analytic approach and a numerical one. The semi-analytic method is based on the modal expansion while a software is used for numerical simulations. The results regarding the E-field profile and the related statistical indexes of merit are presented and used to evaluate the chamber performances. Experiments were also conducted in order to evaluate the chamber. (AU)