Effect of the cathodic polarization on structural and morphological proprieties of FTO and ITO thin films

Author(s)

Pla Cid, C. C. ^[1] ; Spada, E. R. ^{[2, 1]} ; Sartorelli, M. L. ^[1]

Affiliation

^[1] Univ Fed Santa Catarina, Dept Fis, LabSiN, BR-88040900 Florianopolis, SC - Brazil

^[2] Univ Sao Paulo, Inst Fis Sao Carlos, BR-13560970 Sao Carlos, SP - Brazil

• Document type: Journal article
• Source: Applied Surface Science; v. 273, p. 603-606, MAY 15 2013.
• Web of Science Citations: 8

Abstract

This paper deals on the influence of the potentiodynamic stress on structural and morphological proprieties of fluorine-doped tin oxide (FTO, SnO2:F) and indium tin oxide (ITO, In2O3:Sn) commercial substrates. The potential range is between 0.0 and -2.0 (V/SCE) using an electrolyte with neutral pH. The electrochemical behavior was investigated from cyclic voltammetry technique and chronopotentiometric curves. These electrochemical results were associated to the X-ray diffraction (XRD) spectra and morphology images acquired by scanning electron microscopy (SEM). The main results show that structural and morphological properties of FTO substrates after cathodic polarization remain near constant when compared with ITO films. The ITO substrates show morphological changes after treatment and the XRD patterns indicate the formation of a crystalline structure with In metallic characteristic, at neutral pH. (C) 2013 Elsevier B.V. All rights reserved. (AU)

• FAPESP's process: 11/11065-0 - Hybrid solar cells: architecture-based photonic and plasmonic effects
• Grantee: Edna Regina Spada
• Support type: Scholarships in Brazil - Post-Doctorate