Microcantilever chaotic motion suppression in tapping mode atomic force microscope

Author(s)

Balthazar, Jose Manoel ; Tusset, Angelo Marcelo ^[1] ; Thomaz de Souza, Silvio Luiz ; Bueno, Atila Madureira ^[1]

Affiliation

^[1] Univ Tecnol Fed Parana UTFPR, Dept Acad Engn Eletron, BR-84016210 Ponta Grossa, Parana - Brazil

• Document type: Journal article
• Source: PROCEEDINGS OF THE INSTITUTION OF MECHANICAL ENGINEERS PART C-JOURNAL OF ME; v. 227, n. 8, p. 1730-1741, AUG 2013.
• Web of Science Citations: 17

Abstract

The tapping mode is one of the mostly employed techniques in atomic force microscopy due to its accurate imaging quality for a wide variety of surfaces. However, chaotic microcantilever motion impairs the obtention of accurate images from the sample surfaces. In order to investigate the problem the tapping mode atomic force microscope is modeled and chaotic motion is identified for a wide range of the parameter's values. Additionally, attempting to prevent the chaotic motion, two control techniques are implemented: the optimal linear feedback control and the time-delayed feedback control. The simulation results show the feasibility of the techniques for chaos control in the atomic force microscopy. (AU)

• FAPESP's process: 09/09170-0 - Hybrid and digital PLLs synchronization networks nonlinear behavior research with NEMs applications
• Grantee: Atila Madureira Bueno
• Support Opportunities: Scholarships in Brazil - Post-Doctoral