Microcantilever chaotic motion suppression in tapping mode atomic force microscope

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Author(s):	Balthazar, Jose Manoel ; Tusset, Angelo Marcelo ^[1] ; Thomaz de Souza, Silvio Luiz ; Bueno, Atila Madureira ^[1] Total Authors: 4
Affiliation:	^[1] Univ Tecnol Fed Parana UTFPR, Dept Acad Engn Eletron, BR-84016210 Ponta Grossa, Parana - Brazil Total Affiliations: 1
Document type:	Journal article
Source:	PROCEEDINGS OF THE INSTITUTION OF MECHANICAL ENGINEERS PART C-JOURNAL OF ME; v. 227, n. 8, p. 1730-1741, AUG 2013.
Web of Science Citations:	17
Abstract
The tapping mode is one of the mostly employed techniques in atomic force microscopy due to its accurate imaging quality for a wide variety of surfaces. However, chaotic microcantilever motion impairs the obtention of accurate images from the sample surfaces. In order to investigate the problem the tapping mode atomic force microscope is modeled and chaotic motion is identified for a wide range of the parameter's values. Additionally, attempting to prevent the chaotic motion, two control techniques are implemented: the optimal linear feedback control and the time-delayed feedback control. The simulation results show the feasibility of the techniques for chaos control in the atomic force microscopy. (AU)

FAPESP's process:	09/09170-0 - Hybrid and digital PLLs synchronization networks nonlinear behavior research with NEMs applications
Grantee:	Atila Madureira Bueno
Support Opportunities:	Scholarships in Brazil - Post-Doctoral