Full text | |
Author(s): |
Total Authors: 2
|
Affiliation: | [1] Universidade Estadual de Campinas. Instituto de Química
[2] Universidade Estadual de Campinas. Instituto de Química
Total Affiliations: 2
|
Document type: | Journal article |
Source: | Química Nova; v. 24, n. 1, p. 99-104, 2001-02-00. |
Abstract | |
This paper is the second part of an article aimed to present theoretical basis as well as some applications of two infrared reflection techniques: specular reflection and reflection-absorption. It is emphasyzed how much spectral simulation can aid spectral analysis. The usefulness of reflection-absorption spectroscopy as a thin film caracterization technique is stressed. Optical effects such as LO-TO splittings and their observation as Berreman effect are also addressed. (AU) |