Multiuser equipment granted in the Project Fapesp 2017/11986-5: interface controler for atomic force microscope

• Grant number: 19/23181-7
• Support Opportunities: Multi-user Equipment Program
• Start date: December 01, 2019
• End date: November 30, 2026
• Field of knowledge: Physical Sciences and Mathematics - Chemistry - Inorganic Chemistry
• Principal Investigator: Ana Flávia Nogueira
• Grantee: Ana Flávia Nogueira
• Host Institution: Instituto de Química (IQ). Universidade Estadual de Campinas (UNICAMP). Campinas , SP, Brazil
• City of the host institution: Campinas
• Associated research grant: 17/11986-5 - Generation and storage of New Energy: bringing technological development for the country, AP.PCPE
• EMU web page: Página do Equipamento Multiusuário não informada
• Type of equipment: Caracterização de Materiais - Análises de Superficies - Microscopia de sonda (AFM, STM)
• Manufacturer: Fabricante não informado
• Model: Modelo não informado

Abstract

Atomic force microscopy (AFM) is a microscopy widely used for surface analysis of films, particularly organic films such as polymers and very thin films such as graphene films. The Kelvin probe force microscopy is a variant of the AFM and very important for analysing areas with different potentials on the film surface, allowing the location of regions of higher or lower electron density. This variant of traditional AFM microscopy measures the work function between sample and contact. With this new configuration being requested it will be possible to make images with higher resolution for the identification of different phases, components, as well as with much greater sensitivity for Kelvin measurements. (AU)