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A New Method to Quantify X-ray Substructures in Clusters of Galaxies


We present a new method to quantify substructures in clusters of galaxies,based on the analysis of the intensity of structures.This analysis is done in a residual image that is the result of thesubtraction of a surface brightness model, obtained by fitting atwo-dimensional analytical model (beta-model or Sérsic profile) withelliptical symmetry, from the X-ray image.Our method is applied to 34 clusters observed by the Chandra SpaceTelescope that are in the redshift range 0.02