Comparison between the leakage drain current behavior in soi pmosfets and soi nmosfets operating at 300 graus c.

• Grant number: 03/08080-1
• Support Opportunities: Research Grants - Meeting - Brazil
• Start date: September 08, 2003
• End date: September 11, 2003
• Field of knowledge: Engineering - Electrical Engineering - Electrical Materials
• Principal Investigator: Marcello Bellodi
• Grantee: Marcello Bellodi
• Host Institution: Centro Universitário FEI (UNIFEI). Campus de São Bernardo do Campo. São Bernardo do Campo , SP, Brazil