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Simulation and measurment of ion backflow in Gas Electron Multiplier based detectors

Grant number: 19/08671-8
Support type:Scholarships in Brazil - Scientific Initiation
Effective date (Start): June 01, 2019
Effective date (End): December 31, 2019
Field of knowledge:Physical Sciences and Mathematics - Physics
Principal Investigator:Marco Bregant
Grantee:Chiara Mesquita Cerino Carrillo Le Roux
Home Institution: Instituto de Física (IF). Universidade de São Paulo (USP). São Paulo , SP, Brazil

Abstract

One widely spread class of detectors used in high energy physics are the so called Micropattern Gaseous Detectors. Among them, we stress here the ones based on a structure named Gas Electron Multipliers (GEMs). Since their creation, a great amount of work has been done with them. The current project comes in the direction of these efforts focusing on the study of the ion back-flow, which is one of the effects that must be minimized when working with GEMs as to reach optimum operation conditions. Computational methods will be used in order to test conditions of operation that can reduce ion back-flow. These conditions will, then, be tested in laboratory.