Simulation and measurment of ion backflow in Gas Electron Multiplier based detectors

• Grant number: 19/08671-8
• Support Opportunities: Scholarships in Brazil - Scientific Initiation
• Start date: June 01, 2019
• End date: December 31, 2019
• Field of knowledge: Physical Sciences and Mathematics - Physics - Nuclear Physics
• Principal Investigator: Marco Bregant
• Grantee: Chiara Mesquita Cerino Carrillo Le Roux
• Host Institution: Instituto de Física (IF). Universidade de São Paulo (USP). São Paulo , SP, Brazil

Abstract

One widely spread class of detectors used in high energy physics are the so called Micropattern Gaseous Detectors. Among them, we stress here the ones based on a structure named Gas Electron Multipliers (GEMs). Since their creation, a great amount of work has been done with them. The current project comes in the direction of these efforts focusing on the study of the ion back-flow, which is one of the effects that must be minimized when working with GEMs as to reach optimum operation conditions. Computational methods will be used in order to test conditions of operation that can reduce ion back-flow. These conditions will, then, be tested in laboratory.