| Grant number: | 21/09794-6 |
| Support Opportunities: | Scholarships in Brazil - Scientific Initiation |
| Start date: | November 01, 2021 |
| End date: | July 28, 2023 |
| Field of knowledge: | Engineering - Materials and Metallurgical Engineering - Nonmetallic Materials |
| Principal Investigator: | Miguel Ángel Ramírez Gil |
| Grantee: | Pablo Samuel de Freitas Chaves |
| Host Institution: | Faculdade de Engenharia (FEG). Universidade Estadual Paulista (UNESP). Campus de Guaratinguetá. Guaratinguetá , SP, Brazil |
| Associated research grant: | 13/07296-2 - CDMF - Center for the Development of Functional Materials, AP.CEPID |
| Associated scholarship(s): | 22/04461-1 - SINTERING AND ELECTRICAL CHARACTERIZATION OF DENSE CERAMICS IN BULK FORM OF THE CERAMIC SYSTEM CuSn(x)Ti(1-x)O3 (0,0dxd1,0), BE.EP.IC |
Abstract Solid solutions of titanate stannates have been studied more frequently due to the scientific and technological interest aroused by their multifunctionality, with electrical and optical applications. CuSnO3 has relevant photocatalytic activities, as well as CuTiO3, but little is known about the electrical behavior of these materials and their solid solutions. Thus, the objective of this project is to synthesize powders and bulks of the CuSn1-xTixO3 (0.0d xd 1.0) ceramic system and analyze the effect of replacing Sn4+ by Ti4+ on the (micro)structural, optical, dielectric and varistor properties. Solid solutions in the form of powders will be synthesized by solid-state reaction, and in a next step, the powders will be sintered in a conventional furnace at suitable temperatures and times to achieve the form of dense bulks. The structural analysis of the powders at long, medium, and short range will be performed using X-ray diffractometry (XRD), photoluminescent response (PL), ultraviolet visible (UV-Vis) and Raman spectroscopy techniques, their photocatalytic response with rhodamine degradation will also be evaluated. The ceramic systems in the form of bulks will have their (micro)structure characterized by means of data obtained in XRD/Rietveld analysis and scanning electron microscopy (SEM). The dielectric and non-ohmic responses of the material will be studied from the techniques of impedance spectroscopy (IS) and current-voltage (I-V) measurements defining parameters such as dielectric constant and loss, nonlinearity coefficient, breakdown electric field, leakage current, among others related to dielectric and non-ohmic properties, respectively. | |
| News published in Agência FAPESP Newsletter about the scholarship: | |
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