Pattern Recognition for X-Rays Scattering and Diffraction Images

• Grant number: 23/07965-3
• Support Opportunities: Scholarships in Brazil - Scientific Initiation
• Start date: October 01, 2023
• End date: September 30, 2024
• Field of knowledge: Physical Sciences and Mathematics - Physics - Condensed Matter Physics
• Principal Investigator: Cristiano Luis Pinto de Oliveira
• Grantee: Gabriel Brito Granado
• Host Institution: Instituto de Física (IF). Universidade de São Paulo (USP). São Paulo , SP, Brazil

Abstract

In this project, we propose the development of a set of computational tools to facilitate the analysis of two-dimensional small-angle X-ray scattering images. For cases where the studied system has randomly oriented particles, the scattering images have azimuthal symmetry and in this way an integration can be made and one-dimensional curves obtained. However, for cases where the system components have some degree of orientation, the two-dimensional scattering images are anisotropic. In these cases, it is possible to analyze the image as a whole or carry out sectorial integration procedures. In both cases, the procedures are time-consuming and require a lot of experience from the user. With recent experimental advances in laboratory apparatus as well as in large facilities, it is possible to obtain a very large amount of images in a short period. As part of the procedure, it is necessary to process these data for further analysis. With the developments proposed in this project, automated image analysis procedures will be implemented, facilitating data processing and analysis.