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(Reference retrieved automatically from Web of Science through information on FAPESP grant and its corresponding number as mentioned in the publication by the authors.)

Micro Grain Analysis in Plastically Deformed Silicon by 2nd-Order X-Ray Diffraction

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Author(s):
Dina, Gabriel [1] ; Gonzalez, Anal Gomez [1] ; Morelhao, Sergio L. [2, 1] ; Kycia, Stefan [1]
Total Authors: 4
Affiliation:
[1] Univ Guelph, Dept Phys, Guelph, ON - Canada
[2] Univ Sao Paulo, Inst Phys, Sao Paulo, SP - Brazil
Total Affiliations: 2
Document type: Journal article
Source: MRS ADVANCES; v. 3, n. 39, p. 2347-2352, 2018.
Web of Science Citations: 0
Abstract

Second-order diffraction (SOD) of x-rays refers to all diffraction processes where the photons reaching the detector have been diffracted twice within a crystal lattice. By measuring the two dimensional intensity profile of SOD, it is possible to distinguishing rescattering processes taking place inside each grain (perfect crystal domain) or in between grains. These two SOD regimes, usually called dynamical and kinematical, respectively, are ruled by size and relative orientation of the grains. In this work, we demonstrate how to explore SOD phenomena to understand the micro scale grain structure in plastically deformed silicon single crystal. (AU)

FAPESP's process: 18/00176-5 - 2018 MRS Spring Meeting & Exhibit
Grantee:Sérgio Luiz Morelhão
Support Opportunities: Research Grants - Meeting - Abroad