Dynamic heavy ions SEE testing of NanoXplore radiation hardened SRAM-based FPGA: Reliability-performance analysis

Author(s)

Oliveira, A. A. ^[1] ; Benevenuti, F. ^[1] ; Benites, L. ^[1] ; Rodrigues, G. ^[1] ; Kastensmidt, F. ^[1] ; Added, N. ^[2] ; Aguiar, V. ^[2] ; Medina, N. ^[2] ; Guazzelli, M. ^[3] ; Tambara, L. ^{[1, 4]}

Affiliation

^[1] Univ Fed Rio Grande do Sul, Programa Posgrad Microeletron PGMICRO, Porto Alegre, RS - Brazil

^[2] Univ Sao Paulo, Sao Paulo, SP - Brazil

^[3] Ctr Univ FEI, Sao Bernardo Do Campo - Brazil

^[4] Cobham Gaisler AB, Gothenburg - Sweden

• Document type: Journal article
• Source: MICROELECTRONICS RELIABILITY; v. 100, SEP 2019.
• Web of Science Citations: 0

Abstract

NanoXplore is the European pioneer vendor to develop ITAR-free radiation-hardened SRAM-based FPGAs. This work is the first to explore dynamic SEE tests in the NG-Medium FPGA device. The reliability-performance analysis of an embedded unmitigated design is performed under heavy ion-induced errors. Moreover, the improvements of additional user level fault-tolerance techniques, such as redundancy and scrubbing, are explored. The design sensitiveness is evaluated through dynamic cross section, mean fluence to failure, and empiric reliability. Results obtained demonstrate the best tradeoff between area, performance, and reliability is achieved combining full design redundancy, periodic scrubbing, arithmetic functions implemented in DSPs, logical resets between executions, and area-oriented application execution. (AU)

• FAPESP's process: 12/03383-5 - Development of methodology for radiation tests on electronic components
• Grantee: Nilberto Heder Medina
• Support Opportunities: Regular Research Grants