Real-time imaging of atomistic process in one-atom-thick metal junctions

Rodrigues‚ V.; Ugarte‚ D.

Advanced search

Search - Use quotation marks to get a more specific result

Index

Field of knowledge

Start date

Betweenand

(Reference retrieved automatically from Google Scholar through information on FAPESP grant and its corresponding number as mentioned in the publication by the authors.)

Real-time imaging of atomistic process in one-atom-thick metal junctions

Full text
Author(s):	Rodrigues‚ V. ; Ugarte‚ D. Total Authors: 2
Document type:	Journal article
Source:	Physical Review B; v. 63, n. 7, p. 073405, 2001.
Abstract
We present an in situ and time resolved high-resolution transmission electron microscopy study of the atomistic process during the last elongation stages of gold nanojunctions. In particular, we concentrate on suspended chains of atoms, which have shown to be remarkably stable, although they present rather long bonds (3.0-3.6 Angstrom). One-atom-thick junctions are robust, but their attachment points move rather easily on the metal surface, allowing the accommodation of apex movements or rotations. (AU)

FAPESP's process:	96/12546-0 - Conductance quantization in metallic nanostructures
Grantee:	Daniel Mario Ugarte
Support Opportunities:	Regular Research Grants

Short URL