Interfacial water dielectric-permittivity-profile measurements using atomic force microscopy

Teschke‚ O.; Ceotto‚ G.; De Souza‚ EF

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(Reference retrieved automatically from Google Scholar through information on FAPESP grant and its corresponding number as mentioned in the publication by the authors.)

Interfacial water dielectric-permittivity-profile measurements using atomic force microscopy

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Author(s):	Teschke‚ O. ; Ceotto‚ G. ; De Souza‚ EF Total Authors: 3
Document type:	Journal article
Source:	Physical Review E; v. 64, n. 1, p. 011605, 2001.

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