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(Reference retrieved automatically from Web of Science through information on FAPESP grant and its corresponding number as mentioned in the publication by the authors.)

High-Resolution Scanning Transmission Electron Microscopy (HRSTEM) Techniques: High-Resolution Imaging and Spectroscopy Side by Side

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Author(s):
Stroppa, Daniel G. [1, 2] ; Zagonel, Luiz F. [2] ; Montoro, Luciano A. [2] ; Leite, Edson R. [3] ; Ramirez, Antonio J. [1, 2]
Total Authors: 5
Affiliation:
[1] Univ Estadual Campinas, Sch Mech Engn, Campinas, SP - Brazil
[2] Brazilian Nanotechnol Natl Lab, Electron Microscopy Lab, BR-10000 Campinas, SP - Brazil
[3] Univ Fed Sao Carlos, Dept Chem, BR-13560 Sao Carlos, SP - Brazil
Total Affiliations: 3
Document type: Review article
Source: ChemPhysChem; v. 13, n. 2, p. 437-443, FEB 2012.
Web of Science Citations: 7
Abstract

This work presents an overview of high-resolution scanning transmission electron microscopy (HRSTEM) techniques and exemplifies the novel quantitative characterization possibilities that have emerged from recent advances in these methods. The synergistic combination of atomic resolution imaging and spectroscopy provided by HRSTEM is highlighted as a unique feature that can provide a comprehensive analytical description of material properties at the nanoscale. State-of-the-art high-angle annular dark field and annular bright field examples are depicted as well as the use of X-ray energy-dispersive spectroscopy and electron energy-loss spectroscopy for probing samples properties at the atomic scale. In addition, promising techniques such as cathodoluminescence, confocal HRSTEM, and diffraction mapping are introduced. The presented examples and results indicate that HRSTEM-related techniques are fundamental tools for comprehensive assessment of properties at the atomic scale. (AU)