Line tension at high contact angle wetting: Contri... - BV FAPESP
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Line tension at high contact angle wetting: Contribution to interfacial energy at long distances (≫ 100Å) from the triple line contour

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Author(s):
Teschke‚ O. ; de Souza‚ EF
Total Authors: 2
Document type: Journal article
Source: Chemical Physics Letters; v. 447, n. 4, p. 379-383, 2007.
FAPESP's process: 03/12529-4 - Nanotechnology: manufacture of nanostructures and supramolecular structures in liquid medium: observation of structures formed and investigation of processes of formation of nanostructures
Grantee:Omar Teschke
Support Opportunities: Research Projects - Thematic Grants