Caracterização estrutural por difração de raios X de alta resolução de SiAlONs sinterizados com diferentes aditivos

C. Santos; P. A. Suzuki; K. Strecker; S. Kycia; C. R. M. Silva

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(Reference retrieved automatically from SciELO through information on FAPESP grant and its corresponding number as mentioned in the publication by the authors.)

Structural characterization by high-resolution X-ray diffraction of SiAlONs sintered with different additives

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Author(s):	C. Santos ^[1] ; P. A. Suzuki ^[2] ; K. Strecker ^[3] ; S. Kycia ; C. R. M. Silva ^[5] Total Authors: 5
Affiliation:	^[1] FAENQUIL. DEMAR - Brasil ^[2] FAENQUIL. DEMAR - Brasil ^[3] FAENQUIL. DEMAR - Brasil ^[5] IAE/AMR. CTA - Brasil Total Affiliations: 5
Document type:	Journal article
Source:	Cerâmica; v. 51, n. 320, p. 313-317, 2005-12-00.
Abstract
Solid solutions formed by silicon nitride, known as SiAlONs, were prepared using different additives, such as AlN-Y2O3 or AlN-CRE2O3. The mixed oxide CRE2O3 is a solid solution formed by Y2O3 and rare-earth oxides. The high-resolution X-ray diffraction results of the sintered material show the formation of a solid solution. No segregation of second phases was detected. The similarities of structural, morphological and mechanical properties among SiAlONs prepared from different additives containing Y2O3 or CRE2O3 show the possibility of the production of alpha-SiAlON using CRE2O3 rather than Y2O3 as additive at lower cost. (AU)

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