Synthesis and characterization of pure and doped SnO2 nanowires for nanodevices applications

• Grant number: 15/26391-1
• Support Opportunities: Scholarships abroad - Research
• Start date: April 01, 2016
• End date: February 28, 2017
• Field of knowledge: Engineering - Materials and Metallurgical Engineering - Nonmetallic Materials
• Principal Investigator: ALEXANDRE JOSÉ DE CASTRO LANFREDI
• Grantee: ALEXANDRE JOSÉ DE CASTRO LANFREDI
• Host Investigator: Prof Srp Silva
• Host Institution: Centro de Engenharia, Modelagem e Ciências Sociais Aplicadas (CECS). Universidade Federal do ABC (UFABC). Ministério da Educação (Brasil). Santo André , SP, Brazil
• Institution abroad: University of Surrey, England

Abstract

The synthesis and development of devices from one-dimensional 1D material have allowed observing a number of new physical phenomena and create new technological applications as well as provide subsidies for the understanding and explanation of these phenomena. This project proposes to study nanostructured materials based on nanowires of tin oxide (SnO2) pure or doped with Indium (ITO), Zinc (ZTO) or Germanium (GTO), which will be synthesized by using the Vapor-liquid-solid (VLS) and Vapor-solid (VS) growth techniques. The synthesis of these nanoparticles by chemical deposition techniques in the vapor phase will be conducted in highly controlled deposition chambers. The doping will occur during the synthesis or by ionic implantation. By using electron-beam and ion-beam scanning microscopy with nano-manipulators and nanolithography techniques, intends to improve the preparation of nanodevices in order to study the physical properties of such low-dimensional electronic systems. In this context, the chemical analysis of such materials will be carry out by X-ray dispersive energy spectroscopy with nanometric resolution and by ion-beam mass spectroscopy. For nanoscale morphological analysis, in addition to scanning and transmission electronic microscopies, the ultra-high vacuum probe scanning technology will be employed in order to evaluate the atomic scale images and provide a precise chemical analysis and electronic properties of the surface. Further electronic analysis will be conducted by resistivity 4-probe measurements and electrical and optical spectroscopy.