Advanced search
Start date
Betweenand


Proposition of thin films thermomechanical characterization using MEMS devices.

Full text
Author(s):
Marcelo Silva Guimarães
Total Authors: 1
Document type: Master's Dissertation
Press: São Paulo. , gráficos, ilustrações, tabelas.
Institution: Universidade de São Paulo (USP). Escola Politécnica (EP/BC)
Defense date:
Examining board members:
Amilton Sinatora; Marcelo Nelson Paez Carreno; Luiz Otávio Saraiva Ferreira
Advisor: Amilton Sinatora
Field of knowledge: Engineering - Materials and Metallurgical Engineering
Indexed in: Banco de Dados Bibliográficos da USP-DEDALUS; Biblioteca Digital de Teses e Dissertações - USP
Location: Universidade de São Paulo. Biblioteca Central da Escola Politécnica; FD-3030; Universidade de São Paulo. Escola Politécnica. Biblioteca de Engenharia Mecânica, Naval e Oceânica; FD-3030
Abstract

An important factor to develop microsystems is knowledge of materials properties and failure mechanisms. This research studies the thermal actuated microbeam mechanical behavior and propose a method in order to characterize thermomechanical properties of thin films. Silicon Oxynitride microbeams are fabricated and Nomarski microscopy was applied to observe strain and buckling phenomenon ocurrence. (AU)