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(Reference retrieved automatically from Web of Science through information on FAPESP grant and its corresponding number as mentioned in the publication by the authors.)

Effects of crystallization kinetics on the dielectric and electrical properties of BiFeO3 films

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Author(s):
Gonzalez-Abreu, Y. [1, 2] ; Reis, S. P. [3] ; Freitas, F. E. [2, 4] ; Eiras, J. A. [5] ; Araujo, E. B. [2]
Total Authors: 5
Affiliation:
[1] Univ La Habana, Fac Fis, Havana 10400 - Cuba
[2] Sao Paulo State Univ, Dept Phys & Chem, BR-15385000 Ilha Soheira - Brazil
[3] Fed Inst Educ Sci & Technol Sao Paulo, BR-15503110 Votuporanga - Brazil
[4] Univ Rio Verde UniRV, BR-75901970 Rio Verde - Brazil
[5] Univ Fed Sao Carlos, Dept Fis, Grp Mat Ferro, Sao Carlos - Brazil
Total Affiliations: 5
Document type: Journal article
Source: JOURNAL OF ADVANCED DIELECTRICS; v. 11, n. 03 JUN 2021.
Web of Science Citations: 0
Abstract

BiFeO3 thin films were prepared using the chemical solution route on Pt/TiO2/SiO2/Si(100) substrates under different crystallization kinetics. The crystallization kinetic effects on the dielectric and electrical properties have been investigated. These properties included dielectric permittivity, electric modulus, electrical conductivity measurements as a function of the temperature (300-525 K) and frequency (10(2)-10(6) Hz), and leakage current measurements electric field range +/- 30 kV/cm at room temperature. The differences observed in conductivity and current density of the BiFeO3 films were discussed in terms of possible defects induced by the crystallization kinetic. An anomalous relaxor-like dielectric behavior characterized by a broad maximum in the real dielectric permittivity as a function of temperature and the low-frequency dielectric dispersion has been observed. The nonexpected peaks in the real permittivity were accompanied by increasing at least four orders in the conductivity's magnitude at high temperatures. The origin of the relaxor-like dielectric anomalies is discussed, suggesting that the dielectric permittivity peaks are artifacts due to carrier migration correlated to the onset of the Maxwell-Wagner effect. (AU)

FAPESP's process: 17/13769-1 - Multiferroic and ferroelectric materials for energy converters: synthesis, properties, phenomenology and applications
Grantee:José Antonio Eiras
Support Opportunities: Research Projects - Thematic Grants