Fusarium wilt-common bean pathosystem: Pathogen variability and genetic control

Author(s)

Benchimol-Reis, Luciana L. ; Bueno, Cesar J. ; Carbonell, Sergio A. M. ; Chiorato, Alisson F.

• Document type: Journal article
• Source: CROP SCIENCE; v. 63, n. 5, p. 14-pg., 2023-07-29.

Abstract

Sustainable management of plant diseases has been a challenge in the effort to feed a human population that has increased substantially. One of the main diseases that affect common bean and dry bean is Fusarium wilt, caused by the fungus Fusarium oxysporum f. sp. phaseoli (Fop), which can cause losses of up to 100% in crop production. The Fop infection process starts in the roots, followed by colonization and obstruction of xylem vessels, leading to leaf wilting, vascular discoloration, chlorosis, dwarfism, and premature plant death. Fop show high genetic variability, and seven different physiological races have been reported in different regions of the world. There is also a study in which the formae specialis designation has been replaced by Fusarium species. Different studies in common bean have shown that physical, biological, and chemical changes are involved in the Fop resistance mechanism and in the Fusarium and common bean pathosystem. Many studies have been conducted to detect candidate genes and pathways associated with resistance to Fop. This work offers useful information for advancing common bean resistance breeding. (AU)

• FAPESP's process: 21/13796-4 - Genetic mapping and high-resolution genotyping of resistance loci associated to Fusarium oxysporum f. sp. phaseoli in common bean
• Grantee: Luciana Lasry Benchimol-Reis
• Support Opportunities: Regular Research Grants