| Full text | |
| Author(s): |
Kellermann, G.
;
Rodriguez, E.
;
Jimenez, E.
;
Chillcce, E.
;
Cesar, C. L.
;
Barbosa, L. C.
;
Eyink, KG
;
Huffaker, DL
;
Szmuloqicz, F
Total Authors: 9
|
| Document type: | Journal article |
| Source: | MEDICAL IMAGING 2007: PACS AND IMAGING INFORMATICS; v. 6481, p. 6-pg., 2007-01-01. |
| Abstract | |
Multilayers of PbTe quantum dots embedded in SiO2 were fabricated by alternatively use of Laser Ablation and Plasma Enhanced Chemical Vapor Deposition techniques. A set omicron samples containing different PbTe nanoparticles sizes was prepared for the study. The morphological properties of the nanostructured material were studied by means of grazing-incidence small-angle X-ray scattering (GISAXS) and x-ray reflectometry (XRR) techniques. A preliminary analysis of the GISAXS spectra provided information about the multilayer periodicity and its relationship to the size of the deposited PbTe nanoparticles. (AU) | |