Bias stress testing of ZnO and IGZO transistors based on novel testing procedure
Electron properties in nanostructures: metallic oxide nanowires
Investigation of the Robustness of PMOS Power Transistors with Different Layouts A...
Electric double layer transistors based on crystalline ionic conductors
Exploring laser-induced graphene and SERS effect in the development of sustainable...
Influence of the atmosphere control on the performance of thin-film transistors fo...