Evidence of local and global scaling regimes in thin films deposited by sputtering: An atomic force microscopy and electrochemical study

Souza Cruz‚ T.G.; Kleinke‚ MU; Gorenstein‚ A.

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(Reference retrieved automatically from Google Scholar through information on FAPESP grant and its corresponding number as mentioned in the publication by the authors.)

Evidence of local and global scaling regimes in thin films deposited by sputtering: An atomic force microscopy and electrochemical study

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Author(s):	Souza Cruz‚ T.G. ; Kleinke‚ MU ; Gorenstein‚ A. Total Authors: 3
Document type:	Journal article
Source:	Applied Physics Letters; v. 81, n. 26, p. 4922-4924, 2002.

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