Direct evaluation of composition profile‚ strain relaxation‚ and elastic energy of Ge: Si (001) self-assembled islands by anomalous x-ray scattering

Magalhaes-Paniago‚ R.; Medeiros-Ribeiro‚ G.; Malachias‚ A.; Kycia‚ S.; Kamins‚ TI; Williams‚ R.S.

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(Reference retrieved automatically from Google Scholar through information on FAPESP grant and its corresponding number as mentioned in the publication by the authors.)

Direct evaluation of composition profile‚ strain relaxation‚ and elastic energy of Ge: Si (001) self-assembled islands by anomalous x-ray scattering

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Author(s):	Magalhaes-Paniago‚ R. ; Medeiros-Ribeiro‚ G. ; Malachias‚ A. ; Kycia‚ S. ; Kamins‚ TI ; Williams‚ R.S. Total Authors: 6
Document type:	Journal article
Source:	Physical Review B; v. 66, n. 24, p. 245312, 2002.

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