| Full text | |
| Author(s): |
Magri, Vanessa P. R.
[1]
;
Aguiar, Odylio D.
[2]
;
Leme, Claudia B. M. P.
[3]
;
Mosso, Marbey M.
[4]
;
Furtado, S. R.
[5]
;
Carvalho, Juliana B.
[6]
;
Souza, Jorge A. M.
[7]
Total Authors: 7
|
| Affiliation: | [1] Univ Fed Fluminense. Escola Engn TET
[2] INPE. Sao Paulo
[3] Pontificia Univ Catolica Rio de Janeiro. CETUC
[4] Pontificia Univ Catolica Rio de Janeiro. CETUC
[5] INPE. Sao Paulo
[6] Pontificia Univ Catolica Rio de Janeiro. CETUC
[7] Pontificia Univ Catolica Rio de Janeiro. CETUC
Total Affiliations: 7
|
| Document type: | Journal article |
| Source: | Microwave and Optical Technology Letters; v. 56, n. 10, p. 2304-2310, OCT 2014. |
| Web of Science Citations: | 0 |
| Abstract | |
This work describes a simplified procedure to measure ultralow phase-noise in microwave oscillators using the delay properties of high quality factor cavities. Measurement procedures are achieved using only one microwave source and two signals extracted from this feedback loop. Phase noise performance better than -130 dBc/Hz can be achieved through the proposed procedure. (C) 2014 Wiley Periodicals, Inc. (AU) | |
| FAPESP's process: | 08/57866-1 - National Institute of Space Technologies |
| Grantee: | João Luiz Filgueiras de Azevedo |
| Support Opportunities: | Research Projects - Thematic Grants |