EUROSOI-ULIS 2023 - Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon

• Grant number: 23/03006-1
• Support Opportunities: Research Grants - Meeting - Abroad
• Start date: May 08, 2023
• End date: May 12, 2023
• Field of knowledge: Engineering - Electrical Engineering - Electrical, Magnetic and Electronic Measurements, Instrumentation
• Principal Investigator: Michelly de Souza
• Grantee: Michelly de Souza
• Host Institution: Centro Universitário FEI (UNIFEI). Campus de São Bernardo do Campo. São Bernardo do Campo , SP, Brazil
• Associated research grant: 19/15500-5 - Atomistic simulation of nanowire MOSFETs electrical properties, AP.R

Scientific publications

(References retrieved automatically from Web of Science and SciELO through information on FAPESP grants and their corresponding numbers as mentioned in the publications by the authors)

SILVA, LUCAS MOTA BARBOSA DA; PAVANELLO, MARCELO ANTONIO; CASSE, MIKAEL; BARRAUD, SYLVAIN; VINET, MAUD; FAYNOT, OLIVIER; DE SOUZA, MICHELLY. Impact of series resistance on the drain current variability in inversion mode and junctionless nanowire transistors. Solid-State Electronics, v. 208, p. 4-pg., 2023-10-01. (23/03006-1, 19/15500-5)

DE SOUZA, MICHELLY; CERDEIRA, ANTONIO; ESTRADA, MAGALI; CASSE, MIKAEL; BARRAUD, SYLVAIN; VINET, MAUD; FAYNOT, OLIVIER; PAVANELLO, MARCELO A.. Experimental assessment of gate-induced drain leakage in SOI stacked nanowire and nanosheet nMOSFETs at high temperatures. Solid-State Electronics, v. 208, p. 4-pg., 2023-10-01. (19/15500-5, 23/03006-1)