Improved model to determine the generation lifetime in double gate soi nmosfets

Grant number:	07/03888-1
Support Opportunities:	Research Grants - Meeting - Brazil
Start date:	September 03, 2007
End date:	September 06, 2007
Field of knowledge:	Engineering - Electrical Engineering - Electrical, Magnetic and Electronic Measurements, Instrumentation

Principal Investigator:	João Antonio Martino
Grantee:	João Antonio Martino

Host Institution:	Escola Politécnica (EP). Universidade de São Paulo (USP). São Paulo , SP, Brazil

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