Extraction of the silicon film thickness on fully defleted soi nmosfets using the back gate voltage influence.

Grant number:	00/06557-7
Support Opportunities:	Research Grants - Meeting - Brazil
Start date:	September 18, 2000
End date:	September 24, 2000
Field of knowledge:	Engineering - Electrical Engineering - Electrical Materials

Principal Investigator:	João Antonio Martino
Grantee:	João Antonio Martino

Host Institution:	Escola Politécnica (EP). Universidade de São Paulo (USP). São Paulo , SP, Brazil

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