Temperature and oxide thickness influence on the generation lifetime determination in partially depleted soi nmosfets.

Grant number:	05/55126-2
Support Opportunities:	Research Grants - Meeting - Brazil
Start date:	September 04, 2005
End date:	September 07, 2005
Field of knowledge:	Engineering - Electrical Engineering - Electrical, Magnetic and Electronic Measurements, Instrumentation

Principal Investigator:	João Antonio Martino
Grantee:	João Antonio Martino

Host Institution:	Escola Politécnica (EP). Universidade de São Paulo (USP). São Paulo , SP, Brazil

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