Determination of the silicon film thickness and back oxide charge density on graded-channel soi nmosfets.

• Grant number: 03/08200-7
• Support Opportunities: Research Grants - Meeting - Brazil
• Start date: September 08, 2003
• End date: September 11, 2003
• Field of knowledge: Engineering - Electrical Engineering - Electrical Materials
• Principal Investigator: Aparecido Sirley Nicolett
• Grantee: Aparecido Sirley Nicolett
• Host Institution: Faculdade de Tecnologia São Paulo (FATEC São Paulo). Centro Paula Souza (CEETEPS). Secretaria de Desenvolvimento Econômico (São Paulo - Estado). São Paulo , SP, Brazil