Modeling ferroelectric permittivity dependence on electric field and estimation of the intrinsic and extrinsic contributions

Author(s)

Placeres-Jimenez, R. ^[1] ; Rino, J. P. ^[1] ; Eiras, J. A. ^[2]

Affiliation

^[1] Univ Fed Sao Carlos, Dept Fis, Grp Simulacao Computac, Sao Carlos, SP - Brazil

^[2] Univ Fed Sao Carlos, Dept Fis, Grp Mat Ferroeletr, Sao Carlos, SP - Brazil

• Document type: Journal article
• Source: JOURNAL OF PHYSICS D-APPLIED PHYSICS; v. 48, n. 3 JAN 28 2015.
• Web of Science Citations: 2

Abstract

The nonlinear dependence of the dielectric permittivity on electric field epsilon(E) is modeled by the relationship epsilon(E) = epsilon(00) + 1/(alpha + beta E-eff(2)), where E-eff = E + kappa P(E). Using an appropriate mathematical representation of the polarization loop P(E), it is possible to describe correctly the hysteretic behavior of the curve epsilon(E). This model allows the separation of the intrinsic and extrinsic contributions to the dielectric response from the experimental measurement of epsilon(E). The model is validated for PZT and PLZT ferroelectric thin films. It is shown that the polarization hysteresis loop can be reconstructed from the curve epsilon(E), which can be very useful for separating polarization current from leakage current in ferroelectric samples. (AU)

• FAPESP's process: 08/04025-0 - Nanostructured multifunctional multiferroic materials: synthesis, properties, phenomenology and applications
• Grantee: José Antonio Eiras
• Support Opportunities: Research Projects - Thematic Grants
• FAPESP's process: 13/18874-7 - Nanostructure Ferroelectric Perovskites: Domain Wall Collective Motion Modeling and Classical Molecular Dynamics Simulation
• Grantee: Rolando Placeres Jiménez
• Support Opportunities: Scholarships in Brazil - Post-Doctoral