| Full text | |
| Author(s): Show less - |
Kagerer, P.
[1, 2, 3]
;
Fornari, C. I.
[1, 2, 3]
;
Buchberger, S.
[1, 2, 3]
;
Morelhao, S. L.
[4]
;
Vidal, R. C.
[1, 2, 3]
;
Tcakaev, A.
[5]
;
Zabolotnyy, V.
[5]
;
Weschke, E.
[6]
;
Hinkov, V.
[5]
;
Kamp, M.
[7, 8]
;
Buechner, B.
[9, 2, 3, 10]
;
Isaeva, A.
[9, 2, 3, 10]
;
Bentmann, H.
[1, 2, 3]
;
Reinert, F.
[1, 2, 3]
Total Authors: 14
|
| Affiliation: | [1] Univ Wurzburg, Expt Phys 7, D-97074 Wurzburg - Germany
[2] Wurzburg Dresden Cluster Excellence Ctqmat, D-97074 Wurzburg - Germany
[3] Wurzburg Dresden Cluster Excellence Ctqmat, D-01062 Dresden - Germany
[4] Univ Sao Paulo, Inst Fis, BR-05508090 Sao Paulo, SP - Brazil
[5] Univ Wurzburg, Expt Phys 4, D-97074 Wurzburg - Germany
[6] Helmholtz Zentrum Berlin Mat & Energie, Albert Einstein Str 15, D-12489 Berlin - Germany
[7] Univ Wurzburg, Phys Inst, D-97074 Wurzburg - Germany
[8] Univ Wurzburg, Fak Phys & Astron, Rontgen Ctr Complex Mat Syst RCCM, D-97074 Wurzburg - Germany
[9] Tech Univ Dresden, Inst Festkorper & Mat Phys, D-01062 Dresden - Germany
[10] Leibniz IFW Dresden, Helmholtzstr 20, D-01069 Dresden - Germany
Total Affiliations: 10
|
| Document type: | Journal article |
| Source: | Journal of Applied Physics; v. 128, n. 13 OCT 7 2020. |
| Web of Science Citations: | 1 |
| Abstract | |
The layered van der Waals compounds ( MnBi 2 Te 4)( Bi 2 Te 3) were recently established as the first intrinsic magnetic topological insulators. We report a study on the epitaxial growth of ( MnBi 2 Te 4 ) m ( Bi 2 Te 3 ) n films based on the co-deposition of MnTe and Bi 2 Te 3 on BaF 2 (111) substrates. X-ray diffraction and scanning transmission electron microscopy evidence the formation of multilayers of stacked MnBi 2 Te 4 septuple layers and Bi 2 Te 3 quintuple layers with a predominance of MnBi 2 Te 4. The elemental composition and morphology of the films is further characterized by x-ray photoemission spectroscopy and atomic force microscopy. X-ray magnetic circular and linear dichroism spectra are comparable to those obtained for MnBi 2 Te 4 single crystals and confirm antiferromagnetic order in the films. (AU) | |
| FAPESP's process: | 19/01946-1 - X-ray diffraction and scattering in materials: advanced methods II |
| Grantee: | Sérgio Luiz Morelhão |
| Support Opportunities: | Regular Research Grants |