Saturation threshold voltage degradation in deep-submicrometer fully depleted soi nmosfets operating in cryogenic environments.

Grant number:	05/55395-3
Support Opportunities:	Research Grants - Meeting - Abroad
Start date:	October 03, 2005
End date:	October 06, 2005
Field of knowledge:	Engineering - Electrical Engineering - Electrical, Magnetic and Electronic Measurements, Instrumentation

Principal Investigator:	João Antonio Martino
Grantee:	João Antonio Martino

Host Institution:	Escola Politécnica (EP). Universidade de São Paulo (USP). São Paulo , SP, Brazil

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